I am trying to perform a eye diagram test on a device to check its USB performanance.
I am using a board "SQIDD" in order to perform this test. The following figure shows my test setup,
I am using EHCI HSETT software in my PC to perform the test. Pc is connected to the one end of the Sqqidd board and to the other end device is connected.
I am using Tektronix DPO7254 Scope to perform the eye diagram test. In the software i configure as following,
- far end test
- upstream
- D+ and D- are present on the board so the Differential probe is connected on the board.
Initially when i am doing the test the switch in the board is on INIT and once the TEST PACKETS are configured on the PC i toggle the switch to the TEST mode. Doing this i get quite satisfactory eye diagram, as follows,
What I was wondering is why is it necessary to toggle switch from INIT to TEST? What does this actually do?
So after this I perform the test putting the switch on the INIT the eye diagram test measured is as following,
Why is the eye diagram so disturbed? Is it really necessary to use the sqidd board to perform the eye diagram test? Can i also perform as following?
So in the above diagram I am thinking of directly connecting the device to the Host PC and measuring D+ and D- directly on the device. Is this possible? Is this also a way to perform eye diagram test on a device?