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I read in some books that pollution degree can influence the creepage distance in electronic circuits, is there any relation (mathematical) between the pollution degree and the creepage distance.

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Pollution degree is an empirical characteristic and not a real physical quantity, so no, there will be no strict analytical formula. The next best thing is to take a table with creepage distance values for different pollution degrees and approximate these values with some kind of function (usually a polynom).

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  • \$\begingroup\$ If your designing for a standard it will usually have a requirement based on expected transients (Rated impulse withstand voltage) the device is to be able to withstand. Industrial IEC 60947 uses 5.5mm as a default but it can be reduced to 0.1mm based on very good transient control. \$\endgroup\$ – Spoon Apr 15 '15 at 11:22

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