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Flash storage such as SSD has a SMART system like HDDs.
But USB sticks and SD cards lack that.

Optical storage has error/quality scanning that can predict failures early, while error correction is still able to cope.

Is such a quality scan or any other way able to measure the approximate remaining writing cycles for flash transistors?

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    \$\begingroup\$ No, that why you have the Flash controller. Many MCU's for example have a boot block with very low write numbers (in the low thousands). esacademy.com/en/library/technical-articles-and-documents/… ...older but may help. \$\endgroup\$ – Jack Creasey Feb 22 '18 at 18:36
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    \$\begingroup\$ Not a chance. The technology changes faster than the lifetimes, so tested accurate 'wear' indications don't catch up. Estimates as given by manufacturers are available, but like SMART they won't be perfect. \$\endgroup\$ – Whit3rd Feb 22 '18 at 22:37

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