I have a question about calculating the maximum allowable noise for an ADC signal conditioning stage.
I have an existing signal conditioning stage as well as an ADC on a microcontroller.
I would like to use the existing stage and calculate the maximum allowable noise on the input signal in order to maintain an error of less than 1 LSB.
However, I am having a bit of trouble with the math.
The ADC has the following specs:
ENOB: 10 bits
SNR: 60 dB
Input Range: 0 - 5V
Max Sampling Rate: 1 Msps
The input signal has the following characteristics but the noise will vary depending on the sensor used:
BW: 150 Hz
FS Amplitude: 9V pk-pk
The existing signal conditioning stage has an attenuation of .5.
So far I have done the following math using this Analog Devices technical article:
Seven Steps to Successful Analog-to-Digital Signal Conversion
\begin{equation} \text{ADC Input}_{RMS} = \frac{4.5}{2\sqrt{2}} = 883mV \end{equation} \begin{equation} \text{ADC Noise}_{RMS} = \frac{883mv}{10^\frac{60}{10}} = 883 \mu V \end{equation}
\begin{equation} \text{ADC Noise Density} = \frac{883 \mu V}{\sqrt{\frac{1}{2}}f_{sample}} = \frac{883 \mu V}{\sqrt{500KHz}} = 1.24 \frac{\mu V}{\sqrt{Hz}} \end{equation}
Now the signal conditioning stage has the following non-linear spectral noise density found using an LTSpice noise simulation:
Integrating this over the 150 Hz BW gives 926.67nV.
My question from here is how can I relate these two values and calculate the maximum allowable input noise?
Can I simply assume the input noise must be an order of magnitude higher than the root sum square (RSS) of these two noise densities? Am I missing something critical?
If there is any other information I can provide to help please let me know.