In order to aid in testing of the design, it is required that we put it into a "debug mode" whereby specific type of error conditions will occur at random intervals. We must then monitor the impact of these errors on the rest of the system. The type of error to be generated can be specified when we enter this "debug mode".
I can see that LFSR can be used to generate random numbers which is an interesting subject and that we need a seed to start them. However, I have found that I already have certain sources of noise in the system. There are 3 sensors on the board, one is for temperature, one is for acceleration and orientation of the device while the third basically converts readings from a transduer via ADC conversion. All three sources contain noise of course. The range and "at rest" value of these sources are not similar.
How should I exploit one or more of these sources in order to generate random number within specific range e.g 0 to 100 or -1024 to + 1024? Should I just take some bits from the ADC conversion from the sensors and not use the LFSR at all?