Generally it is not dependent, and the info is provided merely for reference.
There may be devices which do exhibit frequency dependence. Which is to say, losses, or diffusion effects, or other physical processes are at play, not just your basic depleted junction capacitance.
I recently learned that SuperJunction structures have bias-rate-dependent resistance, which can make the capacitance look anomalously high or low, depending on how the measurement is taken (time between measurement points, measurement frequency, what conversion is used from impedance to "capacitance"). This is most important for MOSFETs (pretty much all types 200V and up use SJ technology), but various types of diodes (particularly higher voltage (>100V) Si schottky) may be using it as well.
I have confirmed this for one MOSFET. I may make some measurements of diodes at some point, but haven't planned on it yet.
I have seen some diodes not rated for capacitance, which is suspicious. Diodes SBR20A200CTFP is an example. I somewhat suspect they are using recovery time as an alternative to rating the capacitance. Note that recovery (as such) should be impossible as a "schottky". I suspect that it's actually highly nonlinear capacitance (with some associated hysteresis loss) at play here, which has a similar appearance to recovery. (And again, I have yet to measure and confirm whether this is the case, that capacitance and hysteresis is manifesting as recovery for this part.)
I haven't seen any cases yet, where such effects are much more than a curiosity, or that can generally get lumped into switching loss. So don't read this as cause for paranoia.
Literature jumping-off point: COSS Measurements for Superjunction
MOSFETs: Limitations and Opportunities, Zulauf et al., IEEE Transactions On Electron Devices (2018)
Note the hysteresis loop described.