Simple answer: probably not without modifications.

Not so simple answer:

It is possible to measure voltage by measuring via high impedance probe via a larger coupling capacitance to a single wire but not around both. This is called a capacitance transformer.

As impedance rises with lower frequency it becomes much harder to measure due to coupling E-field to C to small C probe.

Inductive coupling is used for single wires and both wires for common mode noise to detect current from B field transformed into a voltage with a burden resistor. The coupling must near ideal to record accurately and often has a lower bandwidth than other methods due to clamp size as defined by probe specs. There is a wide variation of clamp types.

One example is you can detect partial stray line voltage by touching a 10:1 probe then put other hand finger near insulated line single wire and see voltage rise towards line voltage. This is safe due to insulated wire but finger capacitance can be greater than 20pF 10:1 probe so it rises near line voltage but only detecting < 30 uA.

• Then short probe of scope with its ground wire around a small battery wire and now you can detect pulses of short circuit current in probe above say 100k~1MHz and see a glitch where decay time =0.35/f-3dB of this HPF current probe. See what you get and report back.

Simple answer: not possible without modifications.

Not so simple answer:

It is possible to measure voltage by non-contact method measuring via high impedance probe via a larger coupling capacitance to a single wire but not around both. This is called a capacitance transformer. Capacitance is due to gap and area of surface between non-contact conductor.

As impedance rises with lower frequency it becomes much harder to measure due to coupling E-field to C to small C probe.

Inductive coupling is used for single wires and both wires for common mode noise to detect current from B field transformed into a voltage with a burden resistor. The coupling must near ideal to record accurately and often has a lower bandwidth than other methods due to clamp size as defined by probe specs. There is a wide variation of clamp types.

One example is you can detect partial stray line voltage by touching a 10:1 probe then put other hand finger near insulated line single wire and see voltage rise towards line voltage. This is safe due to insulated wire but finger capacitance can be greater than 20pF 10:1 probe so it rises near line voltage but limiting current ~ 30 uA via 10M probe resistance.

• Then short probe of scope with its ground wire around a small battery wire and now you can detect pulses of short circuit current in probe above say 100k~1MHz and see a glitch where decay time =0.35/f-3dB of this HPF current probe. See what you get and report back.

So voltage is measuring E field with very high impedance and current is measuring B field with current loop into low impedance detecting voltage rise.

Simple answer: probably not without modifications.

Not so simple answer:

It is possible to measure voltage by measuring via high impedance probe via a larger coupling capacitance to a single wire but not around both. This is called a capacitance transformer.

As impedance rises with lower frequency it becomes much harder to measure due to coupling E-field to C to small C probe.

Inductive coupling is used for single wires and both wires for common mode noise to detect current from B field transformed into a voltage with a burden resistor. The coupling must near ideal to record accurately and often has a lower bandwidth than other methods due to clamp size as defined by probe specs. There is a wide variation of clamp types.

Simple answer: probably not without modifications.

Not so simple answer:

It is possible to measure voltage by measuring via high impedance probe via a larger coupling capacitance to a single wire but not around both. This is called a capacitance transformer.

As impedance rises with lower frequency it becomes much harder to measure due to coupling E-field to C to small C probe.

Inductive coupling is used for single wires and both wires for common mode noise to detect current from B field transformed into a voltage with a burden resistor. The coupling must near ideal to record accurately and often has a lower bandwidth than other methods due to clamp size as defined by probe specs. There is a wide variation of clamp types.

One example is you can detect partial stray line voltage by touching a 10:1 probe then put other hand finger near insulated line single wire and see voltage rise towards line voltage. This is safe due to insulated wire but finger capacitance can be greater than 20pF 10:1 probe so it rises near line voltage but only detecting < 30 uA.

• Then short probe of scope with its ground wire around a small battery wire and now you can detect pulses of short circuit current in probe above say 100k~1MHz and see a glitch where decay time =0.35/f-3dB of this HPF current probe. See what you get and report back.