Timeline for Will relays benefit from protection in form of a flyback diode?
Current License: CC BY-SA 4.0
3 events
when toggle format | what | by | license | comment | |
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Oct 4, 2023 at 15:27 | comment | added | Tim Williams | In addition to contact life, EMI is greatly reduced. EFT (electrical fast transients) is a typical consequence of mechanical contact opening on inductive loads, and a frequent cause of unexpected MCU resets or other spooky behavior in amateur and prototype circuits using relays. | |
Oct 4, 2023 at 9:46 | vote | accept | MiNiMe | ||
Oct 4, 2023 at 7:58 | history | answered | Spehro 'speff' Pefhany | CC BY-SA 4.0 |