I am having an AC leakage current problem with my measurement setup that I typically use for lock-in measurements.
I employ a 100 M\$\Omega\$ resistor as a voltage-current converter, and in series, a 50 k\$\Omega\$ resistor serves as a dummy load (only for testing purposes), as illustrated in the schematic diagram below. Normally, instead of the dummy load, I would have the DUT, which is basically the channel of a FET transistor.
The signals in the setup are both generated and acquired by a signal conversion unit that provides both analog inputs and outputs. The voltage drop across the 100 M\$\Omega\$ resistor is measured using a separate low-noise differential amplifier unit. All the connections are made with coaxial cables with BNC connectors and BNC Y-splitters.
For testing purposes, I apply both DC and AC voltages to measure the current (the target current in normal condition is 50 nA). The DC signal amplitude is 5V, and the AC signal applied is 5 Vpk at 20 Hz.
The issue arises when I disconnect one end of the load resistor, leaving it floating. In theory, this setup should result in no return path for the current, and therefore, there should be no current flow (also the input impedance to GND @ DC of the differential amplifier is >10T\$\Omega\$). DC measurements work as expected (near zero current measured). However, when I perform (lock-in) AC measurements, I still observe a current reading of approximately 38 nA. If I further remove the load resistor, leaving one end of the 100 M\$\Omega\$ resistor partially open (though it remains connected to the differential amplifier via the BNC Y-splitter), I measure around 27 nA.
I suspect capacitive coupling causing this issue and I’m wondering how can I fix this problem.