sampling with an ADC seems indeed impossible. However, there is no need for it.
The trick for such fast event is to deal with them at a much lower level, that doesn't involve a microprocessor or an ADC, but outputs a signal that can then be measured by an ADC or a micro-controler.
I don't know how it is really done, but there is one way one might achive it :
- there is a signal to trigger the measurement (that one can come from the micro-controler)
- this signal also enables the charging of a capacitor (that is initially empty)
- a phototransistor (or any other sensor detecting the return of the ligght beam) stops the charging of the capacitor
- it is then enough to read the voltage of the capacitor with an ADC, this time, there is plenty of time to do so (if you lidar makes measurement at 10 kHz, you get nearly 100µs for the conversion)
- you empty the capacitor
Basically, micro-controlers, microprocessors (and ADCs) are quit slow, but can do a lot of different things, and it's cheap to develop a new function.
Then you have FPGA (field programable gate arrays, logic gates you can "connect" in software and discreat analog circuits, that are faster, but more complicated to design. Finaly, you get specialized integrated circuits (digital and/or analog) that are extremly fast, but it takes tens of thousands of dollars (if not more) for R&D and launching production.
So if you need something really fast, you will have to go away from the slow universal circuits (micto-controles, ADC, ...) and go into highly specialized circuits, that are much faster